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Two‐dimensional intensity profiles of effective satellites
Author(s) -
Morelhão S. L.,
Avanci L. H.,
Quivy A. A.,
Abramof E.
Publication year - 2002
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801018921
Subject(s) - azimuth , superlattice , scattering , synchrotron radiation , diffraction , optics , satellite , physics , intensity (physics) , beam (structure) , synchrotron , computational physics , radiation , condensed matter physics , astronomy
The observation of a new X‐ray scattering process with synchrotron radiation is reported. The phenomenon is analogous to three‐beam diffraction in a single crystal; however, the features in the azimuthal scans are provided by superlattice‐satellite reflections instead of bulk reflections. These features were named effective satellites and they are observed over the ordinary satellite reflections as a function of the azimuthal angle. Their occurrences have been monitored in completely different superlattices by mapping the incidence and azimuthal angles of the incident X‐ray beam. Effects of structural parameters of the superlattices on the effective satellites as well as the information that can be extracted by measuring their positions are discussed.