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Rietveld refinements on laboratory energy dispersive X‐ray diffraction (EDXD) data
Author(s) -
Ballirano Paolo,
Caminiti Ruggero
Publication year - 2001
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801014728
Subject(s) - rietveld refinement , diffraction , nanocrystalline material , materials science , rutile , crystallography , resolution (logic) , corundum , anatase , x ray crystallography , powder diffraction , mineralogy , crystal structure , analytical chemistry (journal) , optics , chemistry , physics , metallurgy , computer science , biochemistry , organic chemistry , chromatography , photocatalysis , artificial intelligence , catalysis
Rietveld refinements of corundum, a rutile and anatase nanocrystalline synthetic mixture, and gypsum, on laboratory energy dispersive X‐ray diffraction (EDXD) data are reported. Cell parameters, positional and displacement parameters are in reasonable agreement with single‐crystal reference data, despite the rather poor resolution of EDXD data. In particular, good results were obtained for gypsum (unrestrained refinement) with counting times as short as 1000 s.