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Neutron imaging with bent perfect crystals. I. Imaging conditions
Author(s) -
Stoica A. D.,
Popovici M.,
Hubbard C. R.
Publication year - 2001
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801005106
Subject(s) - optics , neutron imaging , neutron , bent molecular geometry , wafer , bragg's law , neutron scattering , materials science , scattering , image resolution , perfect crystal , physics , optoelectronics , diffraction , nuclear physics , composite material
Neutron imaging with bent crystals is considered in the linear approximation of neutron optics. A matrix formalism analogous to that of conventional lens optics is developed. Various imaging conditions are discussed in relation to the crystal deformation type and to possible applications in neutron scattering. All focusing conditions known previously are included as particular cases. Arrangements combining high resolution in imaging with high resolution in scattering are examined. The concept of Bragg mirrors as devices for non‐dispersive imaging is introduced. The most powerful application appears to be that of Bragg mirrors combined with the time‐of‐flight method. Imaging with a thick packet of silicon wafers at the spatial resolution of a single thin wafer is demonstrated.