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Application of quantitative texture analysis to Rietveld profile refinement of neutron diffraction patterns of a zircaloy sample
Author(s) -
Kim Y. C.,
Seong B. S.,
Lee J. H.,
Shin E. J.
Publication year - 2001
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801005064
Subject(s) - rietveld refinement , neutron diffraction , texture (cosmology) , crystallite , materials science , diffraction , neutron , crystallography , sample (material) , orientation (vector space) , crystal structure , optics , chemistry , computer science , physics , geometry , metallurgy , mathematics , thermodynamics , nuclear physics , artificial intelligence , image (mathematics)
The possibility of extending the Rietveld method to incorporate textured polycrystalline materials is demonstrated with a zircaloy sample. By assigning the pole densities obtained by separate texture analysis to the preferred orientation factors (POFs) in the mathematical model of the Rietveld method, good profile refinement results are achieved with the neutron diffraction patterns. The approach of predetermining the individual POF values from quantitative texture information can be used to improve refinement of other parameters related to the analysis of composite phases as well as to crystal structure refinement.