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Kinematical two‐dimensional multiple‐diffraction intensity profiles. Application to ω–ψ scans of silicon and diamond obtained with synchrotron radiation
Author(s) -
Rossmanith E.,
Hupe A,
Kurtz R.,
Schmidt H.,
Krane H.G.
Publication year - 2001
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801001352
Subject(s) - synchrotron radiation , diffraction , optics , diamond , synchrotron , divergence (linguistics) , intensity (physics) , silicon , wavelength , materials science , beam (structure) , physics , radiation , bragg's law , computational physics , optoelectronics , linguistics , philosophy , composite material
In a previous paper by Rossmanith [ J. Appl. Cryst. (2000), 33 , 1405–1414], expressions for the calculation of multiple‐diffraction patterns observed in ω–ψ scans of Bragg reflections were derived within the framework of the kinematical theory, taking into account the divergence and wavelength spread of the incident beam, as well as the mosaic structure of the crystal sample. Agreement with Cu K α experiments was demonstrated. In this paper, it is shown that the theoretical expressions are also suitable for synchrotron radiation experiments.