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A new version of the method for analysing peak broadening caused by local tilt distribution in double‐crystal X‐ray diffraction measurements. Erratum
Author(s) -
Nakashima Kiichi
Publication year - 2001
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889800020203
Subject(s) - tilt (camera) , diffraction , crystal (programming language) , distribution (mathematics) , materials science , crystallography , optics , computational physics , physics , mathematics , chemistry , geometry , mathematical analysis , computer science , programming language
As a result of a printer's error, Fig. 9 of the paper by Nakashima [ J. Appl. Cryst. (2000), 33, 13761385 ] was incorrectly printed. The correct figure is given here.
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