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Electric‐field‐induced structural changes measured with a CCD‐coupled X‐ray image intensifier
Author(s) -
Van Reeuwijk S. J.,
Vonk V.,
PuigMolina A.,
Graafsma H.
Publication year - 2000
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889800013285
Subject(s) - chopper , image intensifier , detector , monochromatic color , optics , electric field , diffraction , physics , image quality , voltage , image (mathematics) , computer science , quantum mechanics , artificial intelligence
The conventional method to measure small induced changes in integrated intensity utilizes a zero‐dimensional detector, which greatly limits the data collection speed. This paper shows that the use of an area detector in combination with an X‐ray chopper decreases the data collection time significantly. A monochromatic diffraction setup using a charge‐coupled device (CCD) detector coupled to an X‐ray image intensifier was constructed and tested. The setup proved to be sufficiently stable to measure changes in integrated intensity well below 0.1%. Subsequently, a data set of a piezoelectric KD 2 PO 4 crystal in an external electric field was collected. The data were merged to yield 77 unique reflections. The induced structural changes were determined by a least‐squares refinement. The results agree very well with experiments in which a zero‐dimensional detector was used. The major improvement is the decrease in data collection time by one order of magnitude, without any degradation of the data quality, offering new possibilities for this type of perturbation study.