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Synchrotron radiation X‐ray powder diffractometer with a cylindrical imaging plate
Author(s) -
Fujiwara A.,
Ishii K.,
Watanuki T.,
Suematsu H.,
Nakao H.,
Ohwada K.,
Fujii Y.,
Murakami Y.,
Mori T.,
Kawada H.,
Kikegawa T.,
Shimomura O.,
Matsubara T.,
Hanabusa H.,
Daicho S.,
Kitamura S.,
Katayama C.
Publication year - 2000
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889800009286
Subject(s) - diffractometer , diffraction , powder diffractometer , synchrotron radiation , materials science , optics , synchrotron , powder diffraction , image resolution , detector , resolution (logic) , x ray , x ray crystallography , radiation , range (aeronautics) , sample (material) , physics , nuclear magnetic resonance , computer science , scanning electron microscope , composite material , artificial intelligence , thermodynamics
A synchrotron radiation X‐ray powder diffractometer for samples of very small amount has been developed to collect high‐quality diffraction patterns under extreme conditions, i.e. at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat‐type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ≤ 122° are collected with a dynamic range of about 10 6 . The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 10 6 . The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reaches R w = 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient and high pressures are also presented.