Epitaxial growth and structure of LaVO 3 and PrVO 3 thin films
Author(s) -
Gauthier Masset,
O. Copie,
Jaâfar Ghanbaja,
K. Dumesnil,
L. Pasquier,
Daniel Pierre,
S. Andrieu
Publication year - 2020
Publication title -
physical review materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.439
H-Index - 42
eISSN - 2476-0455
pISSN - 2475-9953
DOI - 10.1103/physrevmaterials.4.064417
Subject(s) - epitaxy , materials science , orthorhombic crystal system , transmission electron microscopy , high resolution transmission electron microscopy , ferroelectricity , crystallography , multiferroics , molecular beam epitaxy , thin film , condensed matter physics , analytical chemistry (journal) , nanotechnology , layer (electronics) , physics , crystal structure , optoelectronics , chemistry , dielectric , chromatography
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