Composition-dependent structural transition in epitaxial Bi1−xSbx thin films on Si(111) | Zendy

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Composition-dependent structural transition in epitaxial Bi1−xSbx thin films on Si(111)

Author(s) -

Emily Walker,

Sarah E. Muschinske,

Christopher J. Brennan,

Seung Ryul Na,

Tanuj Trivedi,

Stephen D. March,

Yukun Sun,

Tingting Yang,

Alice Yau,

Daehwan Jung,

Adrian Briggs,

E. M. Krivoy,

Minjoo Larry Lee,

Kenneth M. Liechti,

Edward T. Yu,

Deji Akinwande,

Seth R. Bank

Publication year - 2019

Publication title -

physical review materials

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.439

H-Index - 42

eISSN - 2476-0455

pISSN - 2475-9953

DOI - 10.1103/physrevmaterials.3.064201

Subject(s) - materials science , epitaxy , bismuth , orientation (vector space) , crystallography , condensed matter physics , nanoscopic scale , nanotechnology , layer (electronics) , physics , geometry , chemistry , metallurgy , mathematics

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