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Composition-dependent structural transition in epitaxial Bi1xSbx thin films on Si(111)
Author(s) -
Emily Walker,
Sarah E. Muschinske,
Christopher J. Brennan,
Seung Ryul Na,
Tanuj Trivedi,
Stephen D. March,
Yukun Sun,
Tianhao Yang,
Alice Yau,
Daehwan Jung,
Andrew Briggs,
E. M. Krivoy,
Minjoo Larry Lee,
Kenneth M. Liechti,
Edward T. Yu,
Deji Akinwande,
Seth R. Bank
Publication year - 2019
Publication title -
physical review materials
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.439
H-Index - 42
eISSN - 2476-0455
pISSN - 2475-9953
DOI - 10.1103/physrevmaterials.3.064201
Subject(s) - materials science , epitaxy , bismuth , orientation (vector space) , crystallography , condensed matter physics , nanoscopic scale , nanotechnology , layer (electronics) , physics , geometry , chemistry , metallurgy , mathematics

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