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Intrinsic point defects and intergrowths in layered bismuth triiodide
Author(s) -
Sung Beom Cho,
Jaume Gázquez,
Xing Huang,
Yoon Myung,
Parag Banerjee,
Rohan Mishra
Publication year - 2018
Publication title -
physical review materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.439
H-Index - 42
eISSN - 2476-0455
pISSN - 2475-9953
DOI - 10.1103/physrevmaterials.2.064602
Subject(s) - materials science , bismuth , crystallographic defect , semiconductor , triiodide , condensed matter physics , crystallography , scanning transmission electron microscopy , atomic units , transmission electron microscopy , nanotechnology , physics , optoelectronics , chemistry , electrode , electrolyte , dye sensitized solar cell , metallurgy , quantum mechanics

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