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Dielectric properties of thin Cr2O3 films grown on elemental and oxide metallic substrates
Author(s) -
Ather Mahmood,
Michael Street,
Will Echtenkamp,
C.-P. Kwan,
J. P. Bird,
Christian Binek
Publication year - 2018
Publication title -
physical review materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.439
H-Index - 42
eISSN - 2476-0455
pISSN - 2475-9953
DOI - 10.1103/physrevmaterials.2.044401
Subject(s) - materials science , electrical resistivity and conductivity , substrate (aquarium) , dielectric , crystallography , grain boundary , thin film , analytical chemistry (journal) , condensed matter physics , physics , nanotechnology , chemistry , microstructure , composite material , optoelectronics , oceanography , chromatography , quantum mechanics , geology

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