Real-Space Measurement of Surface Roughening
Author(s) -
M.S. Hoogeman,
M.A.J. Klik,
Dietmar Schlößer,
L. Kuipers,
J.W.M. Frenken
Publication year - 1999
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.82.1728
Subject(s) - vicinal , scanning tunneling microscope , condensed matter physics , excited state , space (punctuation) , diffraction , surface (topology) , physics , type (biology) , orientation (vector space) , materials science , correlation function (quantum field theory) , optics , atomic physics , quantum mechanics , geometry , mathematics , ecology , linguistics , philosophy , dielectric , biology
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