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Real-space determination of atomic structure and bond relaxation at theNiSi2-Si(111) interface
Author(s) -
E. J. van Loenen,
J.W.M. Frenken,
J. F. van der Veen,
S. Valeri
Publication year - 1985
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.54.827
Subject(s) - relaxation (psychology) , crystallography , space (punctuation) , materials science , interface (matter) , physics , computer science , molecule , chemistry , quantum mechanics , gibbs isotherm , psychology , social psychology , operating system

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