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Thermal Resistance of Transferred-Silicon-Nanomembrane Interfaces
Author(s) -
Daniel P. Schroeder,
Zlatan Akšamija,
Ashutosh Rath,
Paul M. Voyles,
M. G. Lagally,
M. A. Eriksson
Publication year - 2015
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.115.256101
Subject(s) - interfacial thermal resistance , silicon , materials science , nanoelectronics , thermal , thermal resistance , van der waals force , characterization (materials science) , thermal conductivity , nanotechnology , optoelectronics , composite material , thermodynamics , physics , molecule , quantum mechanics

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