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X-Ray Diffraction of Solid Tin to 1.2 TPa
Author(s) -
Amy Lazicki,
J. R. Rygg,
F. Coppari,
Raymond F. Smith,
D. E. Fratanduono,
Richard Kraus,
G. W. Collins,
R.J. Briggs,
D. G. Braun,
Damian Swift,
J. H. Eggert
Publication year - 2015
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.115.075502
Subject(s) - tin , diffraction , materials science , crystal structure , phase (matter) , crystallography , x ray crystallography , crystal (programming language) , condensed matter physics , molecular physics , physics , optics , chemistry , quantum mechanics , computer science , metallurgy , programming language

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