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Structure ofSrTiO3Films on Si
Author(s) -
C. Stephen Hellberg,
Kristopher Andersen,
Hao Li,
Philip J. Ryan,
J. C. Woicik
Publication year - 2012
Publication title -
physical review letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.108.166101
Subject(s) - silicon , materials science , diffraction , epitaxy , oxide , deposition (geology) , crystallography , analytical chemistry (journal) , nanotechnology , physics , optoelectronics , optics , chemistry , geology , metallurgy , layer (electronics) , paleontology , chromatography , sediment

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