Open AccessIdentification of point defects using high-resolution electron energy loss spectroscopy
Author(s) -
Shuo Wang,
Katia March,
F. A. Ponce,
Peter Rez
Publication year - 2019
Publication title -
physical review. b./physical review. b
Language(s) - English
Resource type - Journals
eISSN - 2469-9969
pISSN - 2469-9950
DOI - 10.1103/physrevb.99.115312
Subject(s) - crystallographic defect , electron energy loss spectroscopy , materials science , spectroscopy , resolution (logic) , high resolution transmission electron microscopy , scanning transmission electron microscopy , semiconductor , band gap , electron , transmission electron microscopy , energy filtered transmission electron microscopy , molecular physics , atomic physics , optics , optoelectronics , condensed matter physics , physics , nanotechnology , quantum mechanics , artificial intelligence , computer science
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