Open AccessThermal conductance of interfaces with amorphous SiO 2
Author(s) -
Judith Kimling,
A. Kobs,
J. Jacobsohn,
Hans Peter Oepen,
David G. Cahill
Publication year - 2017
Publication title -
physical review. b./physical review. b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.78
H-Index - 465
eISSN - 2469-9969
pISSN - 2469-9950
DOI - 10.1103/physrevb.95.184305
Subject(s) - amorphous solid , conductance , sensitivity (control systems) , materials science , condensed matter physics , physics , crystallography , analytical chemistry (journal) , chemistry , chromatography , electronic engineering , engineering
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