Open AccessSignatures of distinct impurity configurations in atomic-resolution valence electron-energy-loss spectroscopy: Application to graphene
Author(s) -
Myron D. Kapetanakis,
Mark P. Oxley,
Wu Zhou,
Stephen J. Pennycook,
Juan Carlos Idrobo,
Sokrates T. Pantelides
Publication year - 2016
Publication title -
physical review. b./physical review. b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.78
H-Index - 465
eISSN - 2469-9969
pISSN - 2469-9950
DOI - 10.1103/physrevb.94.155449
Subject(s) - graphene , impurity , scanning transmission electron microscopy , materials science , spectroscopy , electron energy loss spectroscopy , scattering , electron , atomic physics , molecular physics , physics , transmission electron microscopy , optics , nanotechnology , quantum mechanics
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