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Growth, structure, and electronic properties of nonpolar thin films on a polar substrate:Cr2O3on ZnO (0001) and ZnO (0001¯
Author(s) -
Xiaodong Zhu,
M. D. Morales-Acosta,
Jie Shen,
Frederick J. Walker,
J. J.,
Eric I. Altman
Publication year - 2015
Publication title -
physical review. b, condensed matter and materials physics
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.92.165414
Subject(s) - epitaxy , high resolution transmission electron microscopy , x ray photoelectron spectroscopy , x ray reflectivity , materials science , electron diffraction , transmission electron microscopy , crystallography , substrate (aquarium) , photoemission spectroscopy , thin film , low energy electron diffraction , analytical chemistry (journal) , diffraction , physics , optics , nanotechnology , layer (electronics) , chemistry , nuclear magnetic resonance , oceanography , chromatography , geology

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