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Phonon scattering rates and atomic ordering inAg1xSb1+xTe2+x<…
Author(s) -
Jisheng Ma,
Olivier Delaire,
E. D. Specht,
Andrew F. May,
Olivier Gourdon,
J. D. Budai,
Michael A. McGuire,
Tao Hong,
D. L. Abernathy,
Georg Ehlers,
Evguenia Karapetrova
Publication year - 2014
Publication title -
physical review. b, condensed matter and materials physics
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.90.134303
Subject(s) - scattering , rietveld refinement , neutron diffraction , phonon , condensed matter physics , materials science , phonon scattering , neutron scattering , physics , inelastic neutron scattering , crystallography , diffraction , chemistry , optics

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