Open AccessX-ray diffraction studies of trilayer oscillations in the preferred thickness of In films on Si(111)
Author(s) -
Aaron Gray,
Yang Liu,
Hawoong Hong,
T.C. Chiang
Publication year - 2013
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.87.195415
Subject(s) - electron diffraction , annealing (glass) , physics , condensed matter physics , diffraction , bilayer , materials science , monolayer , crystallography , optics , nanotechnology , chemistry , biochemistry , membrane , thermodynamics
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