Open AccessLocal fields in conductor surface electromigration: A first-principles study in the low-bias ballistic limit
Author(s) -
Kirk H. Bevan,
Wenguang Zhu,
G. M. Stocks,
Hong Guo,
Zhenyu Zhang
Publication year - 2012
Publication title -
physical review. b, condensed matter and materials physics
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.85.235421
Subject(s) - electromigration , conductor , electric field , materials science , electrical conductor , condensed matter physics , nanoscopic scale , ballistic conduction , range (aeronautics) , nanotechnology , physics , electron , quantum mechanics , composite material