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Local magnetic characterization of (Ga,Mn)As continuous thin film using scanning probe force microscopy
Author(s) -
Inhee Lee,
Yuri N. Obukhov,
Jongjoo Kim,
Xia Li,
N. Samarth,
Denis V. Pelekhov,
P. C. Hammel
Publication year - 2012
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.85.184402
Subject(s) - magnetic force microscope , materials science , characterization (materials science) , saturation (graph theory) , microscopy , condensed matter physics , magnetic anisotropy , scanning probe microscopy , thin film , magnetic domain , magnetization , magnetic field , nuclear magnetic resonance , anisotropy , magnetic resonance force microscopy , atomic force acoustic microscopy , ferromagnetic resonance , optics , nanotechnology , physics , mathematics , quantum mechanics , combinatorics

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