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Surface and grain-boundary scattering in nanometric Cu films
Author(s) -
Tik Sun,
Bo Yao,
Andrew P. Warren,
Katayun Barmak,
Michael F. Toney,
Robert E. Peale,
Kevin R. Coffey
Publication year - 2010
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.81.155454
Subject(s) - scattering , materials science , grain boundary , surface roughness , condensed matter physics , annealing (glass) , grain size , electrical resistivity and conductivity , optics , composite material , physics , microstructure , quantum mechanics

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