Electromigration of substitutional impurities in metals: Theory and application in Al and Cu
Author(s) -
J. van Ek,
J.P. Dekker,
A. Lodder
Publication year - 1995
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.52.8794
Subject(s) - electromigration , vacancy defect , electron , scattering , atom (system on chip) , impurity , condensed matter physics , materials science , atomic physics , saddle point , ion , saddle , diffusion , physics , quantum mechanics , mathematical optimization , geometry , mathematics , computer science , composite material , embedded system
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