Far-infrared picosecond time-resolved measurement of the free-induction decay in GaAs:Si
Author(s) -
P. C. M. Planken,
P. C. van Son,
J. N. Hovenier,
T.O. Klaassen,
W.Th. Wenckebach,
B. N. Murdin,
G.M.H. Knippels
Publication year - 1995
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.51.9643
Subject(s) - picosecond , dephasing , free induction decay , photoconductivity , free electron laser , infrared , physics , photon , atomic physics , laser , electron , free electron model , measure (data warehouse) , pulse (music) , optics , materials science , condensed matter physics , quantum mechanics , medicine , spin echo , magnetic resonance imaging , radiology , database , detector , computer science
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