Open AccessValidity of Machine Learning in the Quantitative Analysis of Complex Scanning Near-Field Optical Microscopy Signals Using Simulated Data
Author(s) -
Xinzhong Chen,
Richard Ren,
Mengkun Liu
Publication year - 2021
Publication title -
physical review applied
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.883
H-Index - 75
eISSN - 2331-7043
pISSN - 2331-7019
DOI - 10.1103/physrevapplied.15.014001
Subject(s) - near and far field , computer science , sample (material) , near field scanning optical microscope , optics , field (mathematics) , physics , optical microscope , mathematics , scanning electron microscope , pure mathematics , thermodynamics
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