Using Fourier-Plane Imaging Microscopy for Determining Transition-Dipole-Moment Orientations in Organic Light-Emitting Devices
Author(s) -
Jongchan Kim,
Haonan Zhao,
Shaocong Hou,
Mandeep Khatoniar,
Vinod M. Me,
Stephen R. Forrest
Publication year - 2020
Publication title -
physical review applied
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.883
H-Index - 75
eISSN - 2331-7043
pISSN - 2331-7019
DOI - 10.1103/physrevapplied.14.034048
Subject(s) - oled , materials science , dipole , dopant , transition dipole moment , optics , optoelectronics , moment (physics) , microscopy , doping , physics , layer (electronics) , nanotechnology , quantum mechanics , classical mechanics
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