Open AccessElectrochemical-Reaction-Driven Interfacial Stress in a Solid-Solid Layered Architecture
Author(s) -
Hao Feng,
Wenxiu Wang,
Partha P. Mukherjee
Publication year - 2019
Publication title -
physical review applied
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.883
H-Index - 75
eISSN - 2331-7043
pISSN - 2331-7019
DOI - 10.1103/physrevapplied.11.034038
Subject(s) - materials science , electrochemistry , solid state , dissolution , chemical engineering , solid surface , metal , energy storage , electrochemical energy storage , nanotechnology , chemical physics , electrode , engineering physics , thermodynamics , metallurgy , chemistry , power (physics) , physics , supercapacitor , engineering