Open AccessStructural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films
Author(s) -
S. O. Hruszkewycz,
Qingteng Zhang,
Martin V. Holt,
Matthew J. Highland,
Paul G. Evans,
P. H. Fuoss
Publication year - 2016
Publication title -
physical review. a/physical review, a
Language(s) - English
Resource type - Journals
eISSN - 2469-9934
pISSN - 2469-9926
DOI - 10.1103/physreva.94.043803
Subject(s) - ptychography , optics , materials science , thin film , projection (relational algebra) , diffraction , bragg peak , sensitivity (control systems) , epitaxy , bragg's law , resolution (logic) , ferroelectricity , x ray , physics , optoelectronics , algorithm , computer science , nanotechnology , beam (structure) , engineering , layer (electronics) , electronic engineering , artificial intelligence , dielectric