Open AccessThe reflection of long X-rays
Author(s) -
C. B. O. Mohr
Publication year - 1931
Publication title -
proceedings of the royal society of london. series a, containing papers of a mathematical and physical character
Language(s) - English
Resource type - Journals
eISSN - 2053-9150
pISSN - 0950-1207
DOI - 10.1098/rspa.1931.0148
Subject(s) - refractive index , total internal reflection , optics , x ray optics , reflection (computer programming) , total external reflection , solid angle , beam (structure) , range (aeronautics) , physics , materials science , x ray , computer science , detector , composite material , programming language
.—For X-rays passing through matter, theory and experiment give a refractive index μ slightly less than unity, so that if a beam of X-rays falls on the plane surface of a solid at a small glancing angle less than the critical glancing angle, it is totally reflected. Determinations of the refractive indices of short wave X-rays by the total reflection method have been carried out by a considerable number of observers. The work of Forster and of Doan is of particular importance in that determinations have been made with many refinements of technique for various substances over a range of wave-lengths.