Open AccessSubjective Annoyance From Exposure to Low Frequency Noise of Semiconductor Manufacturing in the Packaging and Testing Processes
Author(s) -
Pao-chiang Chao,
Chiou-Jong Chen,
Ta-Ho Tsao,
Yu-Tung Dai,
Yow-Jer Juang
Publication year - 2011
Publication title -
epidemiology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.901
H-Index - 173
eISSN - 1531-5487
pISSN - 1044-3983
DOI - 10.1097/01.ede.0000392486.59925.03
Subject(s) - annoyance , sound pressure , noise (video) , octave band , octave (electronics) , acoustics , spectrum analyzer , infrasound , environmental science , frequency band , frequency analysis , computer science , telecommunications , physics , loudness , artificial intelligence , image (mathematics) , bandwidth (computing)