Open AccessLONG-TERM RELIABILITY TESTING OF THE HEARTMATE?? II LVAD
Author(s) -
Kenneth C. Butler,
David Farrar
Publication year - 2005
Publication title -
asaio journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.961
H-Index - 66
eISSN - 1538-943X
pISSN - 1058-2916
DOI - 10.1097/00002480-200503000-00124
Subject(s) - pulsatile flow , ventricular assist device , reliability (semiconductor) , seal (emblem) , artificial heart , biomedical engineering , heart failure , medicine , surgery , cardiology , power (physics) , physics , quantum mechanics , art , visual arts