Open AccessREAL WORLD EMI/RFI/ESD TESTING OF AN LVAD SYSTEM
Author(s) -
Roger D. White,
Michael R Knight,
Charles W. Bray,
G. Morello
Publication year - 2003
Publication title -
asaio journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.961
H-Index - 66
eISSN - 1538-943X
pISSN - 1058-2916
DOI - 10.1097/00002480-200303000-00311
Subject(s) - emi , electromagnetic interference , electronics , computer science , envelope (radar) , control (management) , telecommunications , reliability engineering , engineering , electrical engineering , radar , artificial intelligence