Open AccessDevice Reliability
Author(s) -
Tofy Mussivand,
W. J. Keon,
D. W. Hoeppner,
A. A. Ciarkowski,
R. T. V. Kung,
W. J. W. Freeland,
K. C. Butler
Publication year - 1994
Publication title -
asaio journal
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.961
H-Index - 66
eISSN - 1538-943X
pISSN - 1058-2916
DOI - 10.1097/00002480-199440010-00026
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , physics , engineering , thermodynamics , power (physics)