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Determination of Bran Contamination in Wheat Flours Using Ash Content, Color, and Bran Speck Counts
Author(s) -
Kim Y. S.,
Flores R. A.
Publication year - 1999
Publication title -
cereal chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.558
H-Index - 100
eISSN - 1943-3638
pISSN - 0009-0352
DOI - 10.1094/cchem.1999.76.6.957
Subject(s) - bran , wheat flour , chemistry , food science , contamination , color measurement , linear regression , mathematics , raw material , statistics , artificial intelligence , ecology , organic chemistry , computer science , biology
ABSTRACT A fast new method based on image analysis, ScanPro Speck Expert (SPX), to determine the bran contamination in wheat flour was studied and compared with existing methods (air‐oven, ash, and color measurements) using an Agtron color meter and a Minolta chromameter. Twenty‐one hard red winter wheat flour samples with ash contents of 0.30–0.58% were collected from the Kansas State University pilot mill and used for this study. Intrinsic variability in the flour sample because of randomness of bran speck orientation and distribution in the sample holder could result in variation in the speck count. Simple and multiple linear regression analyses showed that estimation of flour ash content from the SPX results ( R 2 = 0.91) would be more accurate than the results from color measurements ( R 2 = 0.66 [Agtron color meter] and 0.74 [ L *]). The added capability of SPX image analyzer to not only count the number of bran specks but also to measure their areas probably increases the accuracy of determining the bran contamination in wheat flour by image processing.