z-logo
open-access-imgOpen Access
Memristive-based in-memory computing: from device to large-scale CMOS integration
Author(s) -
Emilio Pérez-Bosch Quesada,
Eduardo Pérez,
Mamathamba Kalishettyhalli Mahadevaiah,
Christian Wenger
Publication year - 2021
Publication title -
neuromorphic computing and engineering
Language(s) - English
Resource type - Journals
ISSN - 2634-4386
DOI - 10.1088/2634-4386/ac2cd4
Subject(s) - memristor , cmos , wafer , electronic engineering , computer science , scale (ratio) , leakage (economics) , materials science , embedded system , nanotechnology , engineering , physics , quantum mechanics , economics , macroeconomics
With the rapid emergence of in-memory computing systems based on memristive technology, the integration of such memory devices in large-scale architectures is one of the main aspects to tackle. In this work we present a study of HfO 2 -based memristive devices for their integration in large-scale CMOS systems, namely 200 mm wafers. The DC characteristics of single metal–insulator–metal devices are analyzed taking under consideration device-to-device variabilities and switching properties. Furthermore, the distribution of the leakage current levels in the pristine state of the samples are analyzed and correlated to the amount of formingless memristors found among the measured devices. Finally, the obtained results are fitted into a physic-based compact model that enables their integration into larger-scale simulation environments.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here