Open AccessA metrological atomic force microscope system
Author(s) -
Yiting Wu,
Elisa Wirthmann,
Ute Klöpzig,
Tino Hausotte
Publication year - 2021
Publication title -
nano express
Language(s) - English
Resource type - Journals
ISSN - 2632-959X
DOI - 10.1088/2632-959x/abed5e
Subject(s) - optics , metrology , cantilever , deflection (physics) , interferometry , microscope , lens (geology) , physics , system of measurement , materials science , astronomy , composite material
A new metrological atomic force microscope (MAFM) with combined deflection detection system that comprises a homodyne interferometer and an optical beam deflection measuring system are presented. The combination allows the simultaneous three-dimensional detection of position, bending and torsion of the cantilever. Two wedge plates with a wedge angle of 0.5° have been integrated to reduce the disturbing interferences. The new measuring system uses two tiltable plane mirrors and a shiftable focus lens to adjust the direction of the focused laser beam and the position of the focus. The integration of the MAFM head in a nanomeasuring machine (NMM-1) creates the possibility of traceable dimensional measurements over a large range of 25 mm × 25 mm × 5 mm with sub-nanometre resolution. This paper introduces its setup, realisation and metrological properties, such as stability of the characteristic curves, noise level and combined measurement uncertainty. Finally, exemplary measurement results are presented.