Open AccessA method for finding the background potential of quantum devices from scanning gate microscopy data using machine learning
Author(s) -
Carlo Requião da Cunha,
Nobuyuki Aoki,
D. K. Ferry,
YingCheng Lai
Publication year - 2022
Publication title -
machine learning: science and technology
Language(s) - English
Resource type - Journals
ISSN - 2632-2153
DOI - 10.1088/2632-2153/ac6ec7
Subject(s) - artificial intelligence , inverse problem , computer science , artificial neural network , convolutional neural network , quantum , scanning gate microscopy , function (biology) , machine learning , statistical physics , algorithm , physics , mathematics , microscopy , optics , quantum mechanics , mathematical analysis , scanning ion conductance microscopy , scanning confocal electron microscopy , evolutionary biology , biology