Open AccessLow voltage and robust InSe memristor using van der Waals electrodes integration
Author(s) -
Qianyuan Li,
Quanyang Tao,
Yang Chen,
Lingan Kong,
Zhiwen Shu,
Huigao Duan,
Lei Liao,
Yuan Liu
Publication year - 2021
Publication title -
international journal of extreme manufacturing
Language(s) - English
Resource type - Journals
eISSN - 2631-8644
pISSN - 2631-7990
DOI - 10.1088/2631-7990/ac2296
Subject(s) - memristor , materials science , neuromorphic engineering , electrode , optoelectronics , voltage , fabrication , van der waals force , nanotechnology , channel (broadcasting) , electronic engineering , computer science , electrical engineering , physics , engineering , artificial intelligence , medicine , alternative medicine , pathology , quantum mechanics , molecule , artificial neural network