Open AccessHigh-resolution angle-resolved photoemission spectroscopy and microscopy
Author(s) -
Hideaki Iwasawa
Publication year - 2020
Publication title -
electronic structure
Language(s) - English
Resource type - Journals
ISSN - 2516-1075
DOI - 10.1088/2516-1075/abb379
Subject(s) - angle resolved photoemission spectroscopy , photoemission spectroscopy , inverse photoemission spectroscopy , microscopy , materials science , electronic structure , spectroscopy , fermi level , resolution (logic) , photoemission electron microscopy , condensed matter physics , x ray photoelectron spectroscopy , nanotechnology , optics , physics , nuclear magnetic resonance , electron microscope , computer science , quantum mechanics , electron , artificial intelligence
This review outlines fundamental principles, instrumentation, and capabilities of angle-resolved photoemission spectroscopy (ARPES) and microscopy. We will present how high-resolution ARPES enables to investigate fine structures of electronic band dispersions, Fermi surfaces, gap structures, and many-body interactions, and how angle-resolved photoemission microscopy (spatially-resolved ARPES) utilizing micro/nano-focused light allows to extract spatially localized electronic information at small dimensions. This work is focused on specific results obtained by the author from strongly correlated copper and ruthenium oxides, to help readers to understand consistently how these techniques can provide essential electronic information of materials, which can, in principle, apply to a wide variety of systems.