Recent advances in structured illumination microscopy | Zendy

Ying Ma | Zendy; Kai Wen | Zendy; Min Liu | Zendy; Juanjuan Zheng | Zendy; Kaiqin Chu | Zendy; Zachary J. Smith | Zendy; Lixin Liu | Zendy; Peng Gao | Zendy

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Recent advances in structured illumination microscopy

Author(s) -

Ying Ma,

Kai Wen,

Min Liu,

Juanjuan Zheng,

Kaiqin Chu,

Zachary J. Smith,

Lixin Liu,

Peng Gao

Publication year - 2021

Publication title -

journal of physics photonics

Language(s) - English

Resource type - Journals

ISSN - 2515-7647

DOI - 10.1088/2515-7647/abdb04

Subject(s) - instrumentation (computer programming) , computer science , field (mathematics) , microscopy , resolution (logic) , nanotechnology , optics , artificial intelligence , materials science , physics , mathematics , pure mathematics , operating system

Structured illumination microscopy (SIM), is a wide-field, minimally-invasive super-resolution optical imaging approach with optical sectioning capability, and it has been extensively applied to many different fields. During the past decades, SIM has been drawing great attention for both the technique development and applications. In this review, firstly, the basic conception, instrumentation, and functionalities of SIM are introduced concisely. Secondly, recent advances in SIM which enhance SIM in different aspects are reviewed. Finally, the variants of SIM are summarized and the outlooks and perspectives of SIM are presented.

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