Open AccessNanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe
Author(s) -
Xiangyu Ye,
Mengqi Wang,
Pengfei Wang,
Rui Li,
Maosen Guo,
Pei Yu,
Hangyu Liu,
Fazhan Shi,
Ya Wang,
Jiangfeng Du
Publication year - 2021
Publication title -
jphys photonics
Language(s) - English
Resource type - Journals
ISSN - 2515-7647
DOI - 10.1088/2515-7647/abcd86
Subject(s) - nanoscopic scale , vacancy defect , silicon , atomic force microscopy , materials science , nitrogen vacancy center , nanotechnology , nitrogen , conductive atomic force microscopy , atomic physics , optoelectronics , chemistry , crystallography , physics , composite material , organic chemistry , diamond