Nanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe | Zendy

Xiangyu Ye | Zendy; Mengqi Wang | Zendy; Pengfei Wang | Zendy; Rui Li | Zendy; Maosen Guo | Zendy; Pei Yu | Zendy; Hangyu Liu | Zendy; Fazhan Shi | Zendy; Ya Wang | Zendy; Jiangfeng Du | Zendy

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Nanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe

Author(s) -

Xiangyu Ye,

Mengqi Wang,

Pengfei Wang,

Rui Li,

Maosen Guo,

Pei Yu,

Hangyu Liu,

Fazhan Shi,

Ya Wang,

Jiangfeng Du

Publication year - 2020

Publication title -

journal of physics photonics

Language(s) - English

Resource type - Journals

ISSN - 2515-7647

DOI - 10.1088/2515-7647/abcd86

Subject(s) - nanoscopic scale , vacancy defect , silicon , atomic force microscopy , materials science , nanotechnology , nitrogen vacancy center , conductive atomic force microscopy , center (category theory) , kelvin probe force microscope , nitrogen , photoconductive atomic force microscopy , scanning probe microscopy , scanning capacitance microscopy , optoelectronics , chemistry , crystallography , scanning confocal electron microscopy , composite material , scanning electron microscope , organic chemistry , diamond

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