Open AccessQuantitative annular dark-field imaging in the scanning transmission electron microscope—a review
Author(s) -
Christian Dwyer
Publication year - 2021
Publication title -
jphys materials
Language(s) - English
Resource type - Journals
ISSN - 2515-7639
DOI - 10.1088/2515-7639/ac1ab8
Subject(s) - scanning transmission electron microscopy , dark field microscopy , conventional transmission electron microscope , optics , field (mathematics) , electron tomography , materials science , microscope , transmission electron microscopy , nanotechnology , physics , microscopy , mathematics , pure mathematics
This article provides a review of quantitative annular dark-field imaging in the scanning transmission electron microscope, paying particular attention to the methods of image quantification, and the application of quantitative data, including the use of density functional theory calculations, to relate the properties of nanomaterials to atomic-level structure.