Quantitative annular dark-field imaging in the scanning transmission electron microscope—a review | Zendy

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Quantitative annular dark-field imaging in the scanning transmission electron microscope—a review

Author(s) -

Christian Dwyer

Publication year - 2021

Publication title -

journal of physics materials

Language(s) - English

Resource type - Journals

ISSN - 2515-7639

DOI - 10.1088/2515-7639/ac1ab8

Subject(s) - scanning transmission electron microscopy , dark field microscopy , conventional transmission electron microscope , optics , field (mathematics) , electron tomography , materials science , microscope , transmission electron microscopy , nanotechnology , physics , microscopy , mathematics , pure mathematics

This article provides a review of quantitative annular dark-field imaging in the scanning transmission electron microscope, paying particular attention to the methods of image quantification, and the application of quantitative data, including the use of density functional theory calculations, to relate the properties of nanomaterials to atomic-level structure.

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