Crystal growth of (Bi, Pb)2Sr2Ca2Cu3O thin films fabricated via post annealing
Author(s) -
Zon Mori,
S Koba
Publication year - 2019
Publication title -
journal of physics communications
Language(s) - English
Resource type - Journals
ISSN - 2399-6528
DOI - 10.1088/2399-6528/ab3a1a
Subject(s) - annealing (glass) , thin film , materials science , crystallization , analytical chemistry (journal) , recrystallization (geology) , crystal growth , melting point , high temperature superconductivity , atmospheric temperature range , superconductivity , sputtering , crystal (programming language) , mineralogy , crystallography , chemical engineering , metallurgy , condensed matter physics , nanotechnology , chemistry , composite material , thermodynamics , paleontology , physics , chromatography , engineering , biology , programming language , computer science
Post-annealing of superconducting Bi 2 Sr 2 Ca n-1 Cu n O x (BSCCO) thin films deposited by sputtering is essential for obtaining a single 2223 phase. However, optimum annealing temperature is limited to a very narrow range, needing to pass liquid phase for 2223 crystallization while not exceeding re-evaporation point. In this study, we optimized annealing conditions and observed the crystal growth process. As a result, single phase 2223 thin films with critical temperature of 108 K were obtained at 850 °C, while mixed phase thin films of 2223 and 2212 were grown above 855 °C. This is due to the re-evaporation of the thin film compounds, and these results reflect the recrystallization process after melting.
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