Open AccessA system-level method for hardening phase-locked loop to single-event effects
Author(s) -
Bin Liang,
Xinyu Xu,
Hengzhou Yuan,
Jianjun Chen,
Dong Luo,
Yaqing Chi,
H. Sun
Publication year - 2022
Publication title -
materials research express
Language(s) - English
Resource type - Journals
ISSN - 2053-1591
DOI - 10.1088/2053-1591/ac8f87
Subject(s) - phase locked loop , pll multibit , cmos , hardening (computing) , materials science , linear energy transfer , phase margin , charge pump , radiation hardening , radiation , loop (graph theory) , electronic engineering , control theory (sociology) , optoelectronics , computer science , physics , engineering , voltage , optics , electrical engineering , mathematics , operational amplifier , composite material , phase noise , artificial intelligence , amplifier , capacitor , control (management) , layer (electronics) , combinatorics