Open AccessA system-level method for hardening phase-locked loop to single-event effects
Author(s) -
Bin Liang,
Xinyu Xu,
Hengzhou Yuan,
Jianjun Chen,
Deng Luo,
Yaqing Chi,
Hanhan Sun
Publication year - 2022
Publication title -
materials research express
Language(s) - English
Resource type - Journals
ISSN - 2053-1591
DOI - 10.1088/2053-1591/ac8f87
Subject(s) - phase locked loop , pll multibit , cmos , hardening (computing) , linear energy transfer , materials science , phase margin , charge pump , radiation hardening , radiation , electronic engineering , phase (matter) , control theory (sociology) , physics , computer science , optoelectronics , engineering , optics , electrical engineering , voltage , operational amplifier , composite material , artificial intelligence , amplifier , capacitor , control (management) , layer (electronics) , quantum mechanics
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