Open AccessModelling of Kelvin probe surface voltage and photovoltage in dielectric-semiconductor interfaces
Author(s) -
Ruy S. Bonilla
Publication year - 2022
Publication title -
materials research express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.383
H-Index - 35
ISSN - 2053-1591
DOI - 10.1088/2053-1591/ac84c8
Subject(s) - kelvin probe force microscope , surface photovoltage , semiconductor , optoelectronics , materials science , passivation , dielectric , voltage , work function , surface states , semiconductor device , work (physics) , electronics , charge carrier , thin film , nanotechnology , surface (topology) , electrical engineering , physics , engineering , geometry , mathematics , layer (electronics) , quantum mechanics , spectroscopy , atomic force microscopy , thermodynamics
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