Open AccessElectrical conductivity inversion for Nb2O5 nanostructure thin films at different temperatures
Author(s) -
Evan T. Salim,
Jehan A. Saimon,
Marwa K. Abood,
Makram A. Fakhri
Publication year - 2020
Publication title -
materials research express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.383
H-Index - 35
ISSN - 2053-1591
DOI - 10.1088/2053-1591/ab771c
Subject(s) - materials science , electrical resistivity and conductivity , thin film , nanostructure , grain size , grain boundary , conductivity , hall effect , precipitation , composite material , analytical chemistry (journal) , nanotechnology , microstructure , chemistry , electrical engineering , engineering , meteorology , physics , chromatography
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